Since Steno s Law can be further generalized for a single crystal of any material to include the angles between either all identically indexed net planes ( i . e . vectors of the reciprocal lattice, also known as'potential reflections in diffraction experiments') or all identically indexed lattice directions ( i . e . vectors of the direct lattice, also known as zone axes ), opportunities exist for morphological fingerprinting of nanocrystals in the TEM ) by means of transmission electron goniometry.
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