| 11. | Collected Auger electrons are plotted as a function of energy against the broad secondary electron background spectrum.
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| 12. | The internal conversion and Auger electrons cause little damage outside the cell which contains the isotope atom.
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| 13. | The photoabsorption can therefore be monitored by direct detection of these Auger electrons to the total photoelectron yield.
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| 14. | An outer electron will fill the vacant electron position and produce either a characteristic photon or an Auger electron.
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| 15. | Another critical quantity that determines yield of Auger electrons at a detector is the electron impact cross-section.
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| 16. | Each decrease in energy produces bremsstrahlung and Auger electrons, which are below the detector's energy threshold.
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| 17. | The intensity ratio between the Auger electron and X-ray emissions depends on the atomic number " Z ".
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| 18. | Because of the low energy of Auger electrons, most AES setups are run under ultra-high vacuum ( UHV ) conditions.
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| 19. | The range of low-energy secondary electrons is sometimes larger than the range of primary photo-electrons or of Auger electrons.
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| 20. | The process where Auger electrons are emitted from atoms is used in Auger electron spectroscopy to study the elements on the surface of materials.
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