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अंग्रेजी-हिंदी > diffractometer उदाहरण वाक्य

diffractometer उदाहरण वाक्य

उदाहरण वाक्य
11.The repetitive technique of crystallographic data collection and the often high symmetry of crystalline materials cause the diffractometer to record many symmetry-equivalent reflections multiple times.

12.In 1948, North American Philips corporation ( Norelco ) introduced the first commercial X-ray diffractometer product in cooperation with the US Naval Research Laboratories.

13.In the first method, the sample is fixed relative to the vacuum chamber, which is kept as small and light as possible and mounted on the diffractometer.

14.In 1958, the Engineering and Research Laboratory was enlarged to accommodate six laboratory sections that housed specialized instruments, such as a direct reading spectrometer and x-ray diffractometer.

15.A typical diffractometer consists of a source of radiation, a monochromator to choose the wavelength, slits to adjust the shape of the beam, a sample and a detector.

16.It contains more than 20 major instruments and devices including a High-Resolution Mass Spectrometer, Infrared Spectrometer, X-Ray Quadrupole Diffractometer, Laser Raman Spectrometer, FT-IR Spectrometer, and others.

17.Dai's team built the first neutron crystal spectrometer, the first neutron diffractometer, the first zero-energy thermal reactor, the first neutron transmutation doping of monocrystalline silicon, first large-sized electromagnetic separator in China.

18.When a single crystal is examined in an X-ray Diffractometer such that the diffraction intensity is measured cylindrically around the crystal, it is convenient to use cylindrical coordinates to define the reciprocal lattice vectors and their terminal points.

19.General criteria for judging the practical usefulness of detectors for topography applications include spatial resolution, sensitivity, dynamic range ( " color depth ", in black-white mode ), readout speed, weight ( important for mounting on diffractometer arms ), and price.

20.The Lander would have its own payload for the characterization of the " in situ " measurements ( e . g ., close-up camera, panoramic camera, electron microscope, X-ray diffractometer, volatile detector, microbalance, mass spectrometer ).

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